Doctoral Thesis by Mikael Otendal at Department of Applied Physics, Royal Institute of Technology, Stockholm, Sweden 2006.
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Brightness as key performance metric
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Download our latest white paper where we define the terminology and illustrate why brightness is…
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Laboratory High-Contrast X-ray Microscopy of Copper Nanostructures Enabled by a Liquid-Metal-Jet X-ray Source
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Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics
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