Doctoral Thesis by Tomi Tuohimaa at Department of Applied Physics, Royal Institute of Technology, Stockholm, Sweden 2008.
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Brightness as key performance metric
Brightness as key performance metric
for X-ray tubes and benchtop X-ray sources
Download our latest white paper where we define the terminology and illustrate why brightness is…
Ingrid AksnesMarch 1, 2024
Publications
Laboratory High-Contrast X-ray Microscopy of Copper Nanostructures Enabled by a Liquid-Metal-Jet X-ray Source
Kristina Kutukova, Bartlomiej Lechowski, Joerg Grenzer, Peter Krueger, André Clausner, and Ehrenfried Zschech Nanomaterials 2024,…
Ingrid AksnesFebruary 29, 2024
Publications
Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics
Bartlomiej Lechowski, Kristina Kutukova, Joerg Grenzer, Iuliana Panchenko, Peter Krueger, Andre Clausner and Ehrenfried Zschech.…
Ingrid AksnesJanuary 21, 2024